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编号 :

1127906256153628672

Dual Port Probe

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隐藏域元素占位

Dual Port Probe

category:

Semiconductor Test Probes

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  • Details

    · Provide the SS,GSSG,GSGSG probe tip configuration.

    · Wafer differential performance can be measured.

    · Frequency reach 40GHz,50GHz,67GHz,110GHz

    · Excellent tip visibility and scratches for wafer level        

    · precision measurement.