Wafer test probes is an important part of wafer testing industry, which can provide accurate and reliable test data. Wafer testing probes are made of a variety of materials that can detect contact resistance of the wafer, measure resistance and capacitance of the wafer, detect capacitance and resistance of the wafer, and can measure voltage and current of the wafer. In addition, the wafer testing probe can also detect the electronic device parameters of the wafer, such as capacitance, resistance, voltage, power, temperature and other parameters, so as to detect the defects of the wafer, so as to ensure the quality of the wafer.
Wafer test probes have been widely used in wafer testing industry because of their high precision, fast response, good stability, reliability and repeatability. Wafer testing probe can provide accurate and reliable test data, which can help wafer manufacturers to ensure the quality of wafers and bring more business opportunities to wafer manufacturing industry.
In addition, wafer test probes have some other advantages, such as flexibility, ease of operation, low cost, etc., which can provide more convenience for the wafer testing industry. Therefore, the wafer testing probe is an indispensable part of the wafer testing industry, which can bring more business opportunities to the wafer manufacturing industry.
Dloorplf provides probe series with GS, SG, GSG, SS, GSSG, GSGSG and other configurations, covering frequency 40GHz-110GHz, can provide customized services.