Main purpose of wafer test probe

Wafer test probe is a measurement tool used to detect the circuit performance and structure on semiconductor wafer chips. Its main applications are:
1. Test circuit parameters: The Wafer test probe can measure the voltage, current, frequency, power and other parameters of the circuit on the wafer to determine the circuit performance characteristics.
2. Check the circuit structure: Through Wafer test probe, the structure of the circuit on the wafer can be checked to determine whether the structure of the circuit is correct.
3. Measurement of wafer packaging: Wafer test probes can be used to measure the structure of wafer packaging to determine the quality of the package.
4. Check the wafer surface: The Wafer test probe can check for contaminants on the wafer surface to determine the quality of the wafer surface.
The Wafer test probe works by placing the Wafer test probe on the surface of the wafer. When the probe touches the surface, the probe's wires connect the circuit of the wafer so that the parameters and structure of the circuit on the wafer can be measured.

A wafer test probe is a tool used to test wafers that can help technicians better check the quality of wafers. The primary purpose of wafer test probes is to detect wafer size, thickness, surface state, and electrical properties to ensure wafer quality and reliability. In addition, wafer test probes can be used to detect wafer defects so that defects can be found and corrected in a timely manner. Wafer test probes can also be used to test the electrical properties of wafers to ensure their reliability. In addition, wafer test probes can also be used to detect the packaging status of wafers to ensure the reliability and reliability of wafers. The use of wafer test probes can greatly improve the quality of wafers, thus improving the reliability and performance of products. Wafer test probes are therefore a very useful tool to help technicians better check the quality of wafers.