What is Wafer Test Probe
Wafer test probe is a type of semiconductor test probe. It is a tool used to test semiconductor wafers. It can help detect the quality and performance of the wafers. Wafer testing probes can detect wafer size, thickness, surface state, electrical properties, etc., to ensure the quality and performance of the wafer. The use of wafer testing probes can greatly improve the quality of semiconductor wafers, thus improving the reliability and availability of semiconductor products.
Wafer test probes is generally composed of three parts: probe head, probe body and probe tail. The probe head is used to connect the circuit on the wafer surface, the probe body is used to attach the probe head to the surface, and the probe tail is used to connect the test instrument for testing the circuit.
With the rapid development of semiconductor industry, the requirements and accuracy of chip testing technology are also increasing. Depf provides SS,GSSG,GSGSG and other configurations.
It can meet the differential performance test of wafer.
The probe frequency covers 40GHz,50GHz,67GHz and 100GHz
Good tip visibility scratches for wafer level precision measurement.